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Continuous Expert Assembly: Instance-Conditioned Low-Rank Residuals for All-in-One Image Restoration

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์ €์ž

Haisen He, Xiangyu Zou, SongLin Dong, Heng Li, Yihong Gong, Zhiheng Ma

๐Ÿ’ก ๊ฐœ์š”

๋ณธ ๋…ผ๋ฌธ์€ ์•Œ ์ˆ˜ ์—†๊ณ  ๊ณต๊ฐ„์ ์œผ๋กœ ๋ถˆ๊ท ์ผํ•˜๋ฉฐ ๋ณตํ•ฉ์ ์ธ ์‹ค์ œ ์˜์ƒ ์—ดํ™”๋ฅผ ํšจ๊ณผ์ ์œผ๋กœ ์ฒ˜๋ฆฌํ•˜๋Š” ๋‹จ์ผ ๋ณต์› ๋ชจ๋ธ ๊ฐœ๋ฐœ์„ ๋ชฉํ‘œ๋กœ ํ•ฉ๋‹ˆ๋‹ค. ์ด๋ฅผ ์œ„ํ•ด ๊ธฐ์กด์˜ ์ „์—ญ์  ์กฐ๊ฑด ๋ถ€์—ฌ๋‚˜ ๊ณ ์ •๋œ ์ „๋ฌธ๊ฐ€ ํ’€ ํ™œ์šฉ ๋ฐฉ์‹์˜ ํ•œ๊ณ„๋ฅผ ๊ทน๋ณตํ•˜๊ณ ์ž, ๊ฐ ๊ณต๊ฐ„ ํ† ํฐ์ด ๋…๋ฆฝ์ ์ธ ์ €๋žญํฌ ์ž”์ฐจ(residual) ์—…๋ฐ์ดํŠธ๋ฅผ ์กฐ๋ฆฝํ•˜๋Š” ๋™์  ํŒŒ๋ผ๋ฏธํ„ฐํ™” ํ”„๋ ˆ์ž„์›Œํฌ์ธ Continuous Expert Assembly (CEA)๋ฅผ ์ œ์•ˆํ•ฉ๋‹ˆ๋‹ค. CEA๋Š” ์˜์ƒ์˜ ๊ตญ์†Œ์ ์ธ ์—ดํ™” ํŒจํ„ด์— ๋งž์ถ˜ ๋ฏธ์„ธ ์กฐ์ •์„ ํ†ตํ•ด ๋ณต์› ํ’ˆ์งˆ์„ ํ–ฅ์ƒ์‹œํ‚ค๊ณ , ํŠนํžˆ ๊ณต๊ฐ„์ ์œผ๋กœ ๋ณ€ํ™”ํ•˜๊ฑฐ๋‚˜ ๋ณตํ•ฉ์ ์ธ ์—ดํ™”์— ๋Œ€ํ•ด ์šฐ์ˆ˜ํ•œ ์„ฑ๋Šฅ์„ ๋ณด์ž…๋‹ˆ๋‹ค.

๐Ÿ”‘ ์‹œ์‚ฌ์  ๋ฐ ํ•œ๊ณ„

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๋™์ ์ด๊ณ  ๊ตญ์†Œ์ ์ธ ํŒŒ๋ผ๋ฏธํ„ฐํ™”: ๊ธฐ์กด์˜ ์ „์—ญ์ ์ธ ์กฐ๊ฑด ๋ถ€์—ฌ ๋ฐฉ์‹๊ณผ ๋‹ฌ๋ฆฌ, CEA๋Š” ์˜์ƒ์˜ ๊ฐ ๊ณต๊ฐ„ ํ† ํฐ๋ณ„๋กœ ๋…๋ฆฝ์ ์ธ ์ €๋žญํฌ ์ž”์ฐจ ์—…๋ฐ์ดํŠธ๋ฅผ ๋™์ ์œผ๋กœ ์ƒ์„ฑํ•˜์—ฌ ๊ตญ์†Œ์ ์ธ ์—ดํ™” ํŒจํ„ด์— ๋”์šฑ ํšจ๊ณผ์ ์œผ๋กœ ๋Œ€์‘ํ•ฉ๋‹ˆ๋‹ค.
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์•ˆ์ •์ ์ด๊ณ  ํˆฌ๋ช…ํ•œ ์–ด์…ˆ๋ธ”๋ฆฌ: ์™ธ๋ถ€ ํ”„๋กฌํ”„ํŠธ๋‚˜ ๊ณ ์ •๋œ ์ „๋ฌธ๊ฐ€ ํ’€์— ์˜์กดํ•˜์ง€ ์•Š๊ณ , ๊ฐ ํ† ํฐ์ด ์ €๋žญํฌ ์„ฑ๋ถ„๊ณผ์˜ ์œ ์‚ฌ๋„๋ฅผ ํ†ตํ•ด ์ž์‹ ์˜ ์ž”์ฐจ๋ฅผ ์ง์ ‘ ์กฐ๋ฆฝํ•˜๋Š” ๋ฐฉ์‹์€ ์•ˆ์ •์ ์ด๋ฉฐ, ์„ ํ˜• ์–ดํ…์…˜ ๊ด€์ ์„ ํ†ตํ•ด ํˆฌ๋ช…ํ•œ ๋™์ž‘ ๋ฐฉ์‹์„ ์ œ๊ณตํ•ฉ๋‹ˆ๋‹ค.
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์‹คํ—˜ ๊ฒฐ๊ณผ์˜ ํšจ์œจ์„ฑ: ์ œ์•ˆ๋œ CEA๋Š” ๋‹ค์–‘ํ•œ ๋ณตํ•ฉ ์—ดํ™” ๋ฐ์ดํ„ฐ์…‹์—์„œ ๊ธฐ์กด์˜ ๊ฐ•๋ ฅํ•œ ๋ฒ ์ด์Šค๋ผ์ธ ๋ชจ๋ธ๋“ค์„ ๋Šฅ๊ฐ€ํ•˜๋Š” ๋ณต์› ์„ฑ๋Šฅ์„ ๋ณด์—ฌ์ฃผ์—ˆ์œผ๋ฉฐ, ๋™์‹œ์— ํŒŒ๋ผ๋ฏธํ„ฐ ์ˆ˜, FLOPs, ์‹คํ–‰ ์‹œ๊ฐ„ ์ธก๋ฉด์—์„œ๋„ ํšจ์œจ์„ฑ์„ ์œ ์ง€ํ–ˆ์Šต๋‹ˆ๋‹ค.
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